Thermo-mechanical reliability studies of lead-free solder interconnects

Thesis


Depiver, Joshua Adeniyi 2021. Thermo-mechanical reliability studies of lead-free solder interconnects. Thesis
AuthorsDepiver, Joshua Adeniyi
Qualification namePhD
Abstract

Solder interconnections, also known as solder joints, are the weakest link in electronics packaging. Reliability of these miniature joints is of utmost interest - especially in safety-critical applications in the automotive, medical, aerospace, power grid and oil and drilling sectors. Studies have shown that these joints' critical thermal and mechanical loading culminate in accelerated creep, fatigue, and a combination of these joints' induced failures. The ball grid array (BGA) components being an integral part of many electronic modules functioning in mission-critical systems. This study investigates the response of solder joints in BGA to crucial reliability influencing parameters derived from creep, visco-plastic and fatigue damage of the joints. These are the plastic strain, shear strain, plastic shear strain, creep energy density, strain energy density, deformation, equivalent (Von-Mises) stress etc. The parameters' obtained magnitudes are inputted into established life prediction models – Coffin-Manson, Engelmaier, Solomon (Low cycle fatigue) and Syed (Accumulated creep energy density) – to determine several BGA assemblies' fatigue lives.

The joints are subjected to thermal, mechanical and random vibration loadings. The finite element analysis (FEA) is employed in a commercial software package to model and simulate the responses of the solder joints of the representative assemblies' finite element models. As the magnitude and rate of degradation of solder joints in the BGA significantly depend on the composition of the solder alloys used to assembly the BGA on the printed circuit board, this research studies the response of various mainstream lead-free Sn-Ag-Cu (SAC) solders (SAC305, SAC387, SAC396 and SAC405) and benchmarked those with lead-based eutectic solder (Sn63Pb37).

In the creep response study, the effects of thermal ageing and temperature cycling on these solder alloys' behaviours are explored. The results show superior creep properties for SAC405 and SAC396 lead-free solder alloys. The lead-free SAC405 solder joint is the most effective solder under thermal cycling condition, and the SAC396 solder joint is the most effective solder under isothermal ageing operation. The finding shows that SAC405 and SAC396 solders accumulated the minimum magnitudes of stress, strain rate, deformation rate and strain energy density than any other solder considered in this study. The hysteresis loops show that lead-free SAC405 has the lowest dissipated energy per cycle. Thus the highest fatigue life, followed by eutectic lead-based Sn63Pb37 solder. The solder with the highest dissipated energy per cycle was lead-free SAC305, SAC387 and SAC396 solder alloys.

In the thermal fatigue life prediction research, four different lead-free (SAC305, SAC387, SAC396 and SAC405) and one eutectic lead-based (Sn63Pb37) solder alloys are defined against their thermal fatigue lives (TFLs) to predict their mean-time-to-failure for preventive maintenance advice. Five finite elements (FE) models of the assemblies of the BGAs with the different solder alloy compositions and properties are created with SolidWorks. The models are subjected to standard IEC 60749-25 temperature cycling in ANSYS 19.0 mechanical package environment. SAC405 joints have the highest predicted TFL of circa 13.2 years, while SAC387 joints have the least life of circa 1.4 years. The predicted lives are inversely proportional to the magnitude of the areas of stress-strain hysteresis loops of the solder joints. The prediction models are significantly consistent in predicted magnitudes across the solder joints irrespective of the damage parameters used. Several failure modes drive solder joints and damage mechanics from the research and understand an essential variation in the models' predicted values. This investigation presents a method of managing preventive maintenance time of BGA electronic components in mission-critical systems. It recommends developing a novel life prediction model based on a combination of the damage parameters for enhanced prediction.

The FEA random vibration simulation test results showed that different solder alloys have a comparable performance during random vibration testing. The fatigue life result shows that SAC405 and SAC396 have the highest fatigue lives before being prone to failure. As a result of the FEA simulation outcomes with the application of Coffin-Manson's empirical formula, the author can predict the fatigue life of solder joint alloys to a higher degree of accuracy of average ~93% in an actual service environment such as the one experienced under-the-hood of an automobile and aerospace. Therefore, it is concluded that the combination of FEA simulation and empirical formulas employed in this study could be used in the computation and prediction of the fatigue life of solder joint alloys when subjected to random vibration. Based on the thermal and mechanical responses of lead-free SAC405 and SAC396 solder alloys, they are recommended as a suitable replacement of lead-based eutectic Sn63Pb37 solder alloy for improved device thermo-mechanical operations when subjected to random vibration (non-deterministic vibration).

The FEA simulation studies' outcomes are validated using experimental and analytical-based reviews in published and peer-reviewed literature.

KeywordsThermo-mechanical; Creep; Fatigue Failure; Random Vibration
Year2021
PublisherUniversity of Derby
N/A
Web address (URL)hdl:10545/625825
File
File Access Level
Open
File
File Access Level
Open
File
File Access Level
Open
Publication process dates
Deposited15 Jun 2021, 09:56
Publication dates03 Jun 2021
ContributorsMallik, Sabuj (Advisor) and Lu, Yiling (Advisor)
Permalink -

https://repository.derby.ac.uk/item/94z21/thermo-mechanical-reliability-studies-of-lead-free-solder-interconnects

Download files


File
license.txt
File access level: Open

license_rdf
File access level: Open

  • 179
    total views
  • 106
    total downloads
  • 8
    views this month
  • 3
    downloads this month

Export as

Related outputs

Characterising Solder Materials from Random Vibration Response of their Interconnects in BGA Packaging
DEPIVER, J., Mallik, S. and Amalu, E. H. 2023. Characterising Solder Materials from Random Vibration Response of their Interconnects in BGA Packaging. Journal of Electronic Materials. pp. 1-17. https://doi.org/10.1007/s11664-023-10394-x
Creep-Fatigue Behaviours of Sn-Ag-Cu Solder Joints in Microelectronics Applications
Depiver, Joshua Adeniyi, Sabuj, Mallik, Amalu, Emeka H and Lu, Yiling 2021. Creep-Fatigue Behaviours of Sn-Ag-Cu Solder Joints in Microelectronics Applications. Production and Manufacturing Research.
Thermal Fatigue Life of Ball Grid Array (BGA) Solder Joints Made From Different Alloy Compositions
Depiver, Joshua Adeniyi, Sabuj, Mallik and Amalu, Emeka H 2021. Thermal Fatigue Life of Ball Grid Array (BGA) Solder Joints Made From Different Alloy Compositions. Engineering Failure Analysis. 125, pp. 1-26. https://doi.org/10.1016/j.engfailanal.2021.105447
Comparing and benchmarking fatigue behaviours of various sac solders under thermo-mechanical loading
Depiver, Joshua Adeniyi, Mallik, Sabuj and Amalu, Emeka H 2020. Comparing and benchmarking fatigue behaviours of various sac solders under thermo-mechanical loading. IEEE. https://doi.org/10.1109/ESTC48849.2020.9229699
Effective solder for improved thermo-mechanical reliability of solder joints in ball grid array (BGA) soldered on printed circuit board (PCB)
Depiver, Joshua Adeniyi, Sabuj, Mallik and Amalu, Emeka H 2020. Effective solder for improved thermo-mechanical reliability of solder joints in ball grid array (BGA) soldered on printed circuit board (PCB). Springer. https://doi.org/10.1007/s11664-020-08525-9
Solder joint failures under thermo-mechanical loading conditions – a review
Depiver, Joshua Adeniyi, Mallik, Sabuj and Harmanto, Dani 2020. Solder joint failures under thermo-mechanical loading conditions – a review. Advances in Materials and Processing Technologies. https://doi.org/10.1080/2374068X.2020.1751514
Creep damage of BGA solder interconnects subjected to thermal cycling and isothermal ageing
Depiver, Joshua Adeniyi, Mallik, Sabuj, Amalu, Emeka H and Harmanto, Dani 2019. Creep damage of BGA solder interconnects subjected to thermal cycling and isothermal ageing. IEEE Xplore.
Creep response of various solders used in soldering ball grid array (BGA) on printed circuit board (PCB)
Depiver, Joshua Adeniyi, Mallik, Sabuj and Amalu, Emeka H 2019. Creep response of various solders used in soldering ball grid array (BGA) on printed circuit board (PCB). Newsroom Limited.